The “center-of-gravity” and cross-correlation, ,, ,, , methods can reliably identify the location of the forward-scattered spot if the whole diffraction pattern is symmetric about the spot. There are five commonly used methods for locating the forward-scattered spot in a diffraction pattern. ![]() Most of these programs require some manual intervention or a centrally symmetric pattern to work accurately, ,, ,, ,, ,, ,, ,, ,, ,. Software for locating the position of the forward-scattered beam in single crystal diffraction patterns, however, is not fully automated and has some limitations. Diffraction rings from polycrystalline samples can be analyzed automatically with a software that utilizes a circular Hough transform. Several software packages are available for doing portions of these operations on digital images. To perform a precise analysis of SADPs, one has to determine accurately the location of the forward-scattered spot – which corresponds to the origin of reciprocal space for the pattern – and the location of individual diffraction spots and/or diffraction rings. Selected area diffraction patterns (SADPs) taken by transmission electron microscope (TEM) are widely used to identify the crystal structure of microscopic regions within materials.
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